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Study of the impact of electromigration on integrated circuit performance and reliability at design level.

R. O. NunesR. L. de Orio
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • integrated circuit
  • statistical analysis
  • design process
  • factors influencing
  • deeper understanding
  • digital images
  • empirical studies
  • software architecture
  • positive effects
  • gender differences