Martin Versen

Publication Activity (10 Years)

Years Active: 2006-2023
Publications (10 Years): 7

Top Topics

Fluorescence Microscopy

Reliable Detection

Pattern Analysis

Top Venues

Microelectron. Reliab.

Publications

Maximilian Wohlschläger, Yamna Khan, Nina Leiter, Martin Versen, Martin G. J. Löder, Christian Laforsch
Combining BLOB-Detection and MLP to Detect and Identify Plastics in an Environmental Matrix. SAS (2023)
Nina Leiter, Maximilian Wohlschläger, Maximilian Dietlmeier, Martin Versen, Martin G. J. Löder, Christian Laforsch
Comparative Analysis of Fluorescence Properties of Post-Consumer Wood Using FD-FLIM. SAS (2023)
Maximilian Wohlschlager, Nina Leiter, Maximilian Dietlmeier, Martin G. J. Löder, Martin Versen, Christian Laforsch
Comparison of Two Classification Methods Trained with FD-FLIM Data to Identify and Distinguish Plastics from Environmental Materials. IJCNN (2023)
Nina Leiter, Maximilian Dietlmeier, Maximilian Wohlschläger, Martin G. J. Löder, Martin Versen, Christian Laforsch
Development of a Neural Network for Automatic Classification of Post-Consumer Wood Using Rapid-FLIM. SAS (2023)
Georgekutty Jose Maniyattu, Eldho Geegy, Nina Leiter, Maximilian Wohlschlager, Martin Versen, Christian Laforsch
Development of a neural network to identify plastics using Fluorescence Lifetime Imaging Microscopy. SAS (2022)
Maximilian Wohlschlager, Martin Versen, Heinz Langhals
A method for sorting of plastics with an apparatus specific quantum efficiency approach. SAS (2019)
Martin Versen, W. Ernst, Prince Gulati
A row hammer pattern analysis of DDR2 SDRAM. Microelectron. Reliab. (2017)
Martin Versen, W. Ernst, G. Singh, Prince Gulati
Test setup for reliability studies of DDR2 SDRAM. Microelectron. Reliab. 55 (9-10) (2015)
Martin Versen, Stefan Kipfelsberger
Introduction to microcomputer technology with the MSP430 Launch Pad in remote labs. EDUCON (2014)
Martin Versen, Achim Schramm, Jan Schnepp, Dorina Diaconescu
Test Instrumentation for a Laser Scanning Localization Technique for Analysis of High Speed DRAM devices. DATE (2008)
Martin Versen, Achim Schramm, Daewon Lee, Ronny Schneider
Address Decoder Test and Verification by Generalization of Application Fail Sequences. MBMV (2006)