M. K. Shih

Publication Activity (10 Years)

Years Active: 2006-2007
Publications (10 Years): 0

Publications

D. S. Liu, M. K. Shih, W. H. Huang
Measurement and analysis of contact resistance in wafer probe testing. Microelectron. Reliab. 47 (7) (2007)
D. S. Liu, M. K. Shih
Experimental method and FE simulation model for evaluation of wafer probing parameters. Microelectron. J. 37 (9) (2006)