Lampros Leontaris

Publication Activity (10 Years)

Years Active: 2020-2023
Publications (10 Years): 7

Top Topics

Fault Diagnosis

Illumination Correction

Top Venues

IEEE Trans. Ind. Electron.

IEEE Trans. Ind. Informatics

Simul. Model. Pract. Theory

Publications

Apostolos Evangelidis, Nikolaos Dimitriou, Lampros Leontaris, Dimosthenis Ioannidis, Gregory Tinker, Dimitrios Tzovaras
A Deep Regression Framework Toward Laboratory Accuracy in the Shop Floor of Microelectronics. IEEE Trans. Ind. Informatics 19 (3) (2023)
Lampros Leontaris, Andreana Mitsiaki, Paschalis Charalampous, Nikolaos Dimitriou, Eleni Leivaditou, Aristoklis Karamanidis, George Margetis, Konstantinos C. Apostolakis, Sebastián Pantoja, Constantine Stephanidis, Dimitrios Tzovaras, Elpiniki Papageorgiou
A blockchain-enabled deep residual architecture for accountable, in-situ quality control in industry 4.0 with minimal latency. Comput. Ind. 149 (2023)
Lampros Leontaris, Nikolaos Dimitriou, Dimosthenis Ioannidis, Konstantinos Votis, Dimitrios Tzovaras, Elpiniki Papageorgiou
An Autonomous Illumination System for Vehicle Documentation Based on Deep Reinforcement Learning. IEEE Access 9 (2021)
Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras
A Deep Learning Framework for Simulation and Defect Prediction Applied in Microelectronics. CoRR (2020)
Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras
Fault Diagnosis in Microelectronics Attachment Via Deep Learning Analysis of 3-D Laser Scans. IEEE Trans. Ind. Electron. 67 (7) (2020)
Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras
A Deep Learning framework for simulation and defect prediction applied in microelectronics. Simul. Model. Pract. Theory 100 (2020)
Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras
Fault Diagnosis in Microelectronics Attachment via Deep Learning Analysis of 3D Laser Scans. CoRR (2020)