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A Deep Learning Framework for Simulation and Defect Prediction Applied in Microelectronics.
Nikolaos Dimitriou
Lampros Leontaris
Thanasis Vafeiadis
Dimosthenis Ioannidis
Tracy Wotherspoon
Gregory Tinker
Dimitrios Tzovaras
Published in:
CoRR (2020)
Keyphrases
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deep learning
multiscale
object recognition
case study
pairwise
active learning