Kiran B. Doreswamy

Publication Activity (10 Years)

Years Active: 1998-2003
Publications (10 Years): 0

Publications

Manan Syal, Michael S. Hsiao, Kiran B. Doreswamy, Sreejit Chakravarty
Efficient Implication - Based Untestable Bridge Fault Identifier. VTS (2003)
Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy
Resource-Constrained Compaction of Sequential Circuit Test Sets. VLSI Design (2000)
Surendra Bommu, Kiran B. Doreswamy, Srimat T. Chakradhar
A Practical Vector Restoration Technique for Large Sequential Circuits. J. Electron. Test. 16 (5) (2000)
Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy
Vector Restoration Using Accelerated Validation and Refinement. Asian Test Symposium (1998)
Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy
Static compaction using overlapped restoration and segment pruning. ICCAD (1998)
Surendra Bommu, Srimat T. Chakradhar, Kiran B. Doreswamy
Static test sequence compaction based on segment reordering and accelerated vector restoration. ITC (1998)