Resource-Constrained Compaction of Sequential Circuit Test Sets.
Surendra BommuSrimat T. ChakradharKiran B. DoreswamyPublished in: VLSI Design (2000)
Keyphrases
- resource constrained
- test set
- resource constraints
- wireless sensor networks
- error rate
- sensor networks
- visual sensor networks
- resource limitations
- training set
- training data
- embedded systems
- multipath
- leader follower
- real time
- evolutionary algorithm
- search space
- shortest path
- feature space
- traveling salesman problem
- machine learning
- circuit design
- data sets
- training and test sets