Jimmie J. Wortman

Publication Activity (10 Years)

Years Active: 1993-2001
Publications (10 Years): 0

Publications

Nian Yang, Jimmie J. Wortman
A study of the effects of tunneling currents and reliability of sub-2 nm gate oxides on scaled n-MOSFETs. Microelectron. Reliab. 41 (1) (2001)
Nino A. Masnari, John R. Hauser, Gerald Lucovsky, Dennis M. Maher, Robert J. Markunas, Mehmet C. Bztork, Jimmie J. Wortman
Cener for advanced electronic materials processing. Proc. IEEE 81 (1) (1993)