James S. Tandon

Publication Activity (10 Years)

Years Active: 2008-2023
Publications (10 Years): 2

Top Topics

Edge Detection Algorithms

Markov Processes

Top Venues

IEICE Trans. Fundam. Electron. Commun. Comput. Sci.

Publications

James S. Tandon
Beyond Integer Quantization: Approximate Arithmetic for Machine Learning Accelerators : (Invited Paper). ICICDT (2023)
James S. Tandon, Satoshi Komatsu, Takahiro J. Yamaguchi, Kunihiro Asada
A comparative study of body biased time-to-digital converters based on stochastic arbiters and stochastic comparators. NEWCAS (2016)
James S. Tandon, Takahiro J. Yamaguchi, Satoshi Komatsu, Kunihiro Asada
A subsampling stochastic coarse-fine ADC with SNR 55.3dB and >5.8TS/s effective sample rate for an on-chip signal analyzer. ISCAS (2014)
Satoshi Komatsu, Takahiro J. Yamaguchi, Mohamed Abbas, Nguyen Ngoc Mai Khanh, James S. Tandon, Kunihiro Asada
A Flash TDC with 2.6-4.2ps Resolution Using a Group of UnbalancedCMOS Arbiters. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (3) (2014)
Takahiro J. Yamaguchi, James S. Tandon, Satoshi Komatsu, Kunihiro Asada
A Novel Circuit for Transition-Edge Detection: Using a Stochastic Comparator Group to Test Transition-Edge. ATS (2014)
Takahiro J. Yamaguchi, James S. Tandon, Satoshi Komatsu, Kunihiro Asada
A novel test structure for measuring the threshold voltage variance in MOSFETs. ITC (2013)
James S. Tandon, Takahiro J. Yamaguchi, Satoshi Komatsu, Kunihiro Asada
A stochastic sampling time-to-digital converter with tunable 180-770fs resolution, INL less than 0.6LSB, and selectable dynamic range offset. CICC (2013)
James S. Tandon, Masahiro Sasaki, Makoto Ikeda, Kunihiro Asada
A design-for-test apparatus for measuring on-chip temperature with fine granularity. ISQED (2012)
James S. Tandon, Steven E. Butner
Bounding Communication Energy Overhead in Parallel Networks with Power-Delay Scalability. ICPADS (2008)