H. Q. S. Dang

Publication Activity (10 Years)

Years Active: 2012-2012
Publications (10 Years): 0

Top Topics

High Reliability

Software Reliability

Top Venues

Microelectron. Reliab.

Publications

H. Q. S. Dang, Martin R. Corfield, Alberto Castellazzi, C. Mark Johnson, Patrick Wheeler
Repetitive high peak current pulsed discharge film-capacitor reliability testing. Microelectron. Reliab. 52 (9-10) (2012)