Gurjeet S. Saund

Publication Activity (10 Years)

Years Active: 1995-1999
Publications (10 Years): 0

Publications

C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal
A functional-level testability measure for register-level circuits and its estimation. Microprocess. Microsystems 22 (9) (1999)
Michael S. Hsiao, Gurjeet S. Saund, Elizabeth M. Rudnick, Janak H. Patel
Partial Scan Selection Based on Dynamic Reachability and Observability Information. VLSI Design (1998)
Gurjeet S. Saund, Michael S. Hsiao, Janak H. Patel
Partial Scan beyond Cycle Cutting. FTCS (1997)
C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal
A STAFAN-like functional testability measure for register-level circuits. Asian Test Symposium (1995)