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A functional-level testability measure for register-level circuits and its estimation.

C. P. RavikumarGurjeet S. SaundNidhi Agrawal
Published in: Microprocess. Microsystems (1999)
Keyphrases
  • optimal solution
  • higher level
  • databases
  • levels of abstraction
  • real time
  • data sets
  • neural network
  • data mining
  • medical images