A STAFAN-like functional testability measure for register-level circuits.

C. P. Ravikumar Gurjeet S. Saund Nidhi Agrawal

Published in: Asian Test Symposium (1995)

Keyphrases

similarity measure
high speed
data sets
distance measure
higher level
information theory
levels of abstraction
feature selection
image processing
video sequences
mutual information
analog circuits