Gabin An

Publication Activity (10 Years)

Years Active: 2018-2024
Publications (10 Years): 24

Top Topics

Statistical Inference

Artificially Generated

Fault Localization

Top Venues

ACM SIGSOFT Softw. Eng. Notes

ESEC/SIGSOFT FSE

Publications

Sungmin Kang, Gabin An, Shin Yoo
A Quantitative and Qualitative Evaluation of LLM-Based Explainable Fault Localization. Proc. ACM Softw. Eng. 1 (FSE) (2024)
William B. Langdon, Gabin An, Aymeric Blot, Vesna Nowack, Justyna Petke, Shin Yoo, Oliver Krauss, Erik M. Fredericks, Daniel Blackwell
The 13th International Workshop on Genetic Improvement(GI @ ICSE 2024). ACM SIGSOFT Softw. Eng. Notes 49 (3) (2024)
Gabin An, Jingun Hong, Naryeong Kim, Shin Yoo
Fonte: Finding Bug Inducing Commits from Failures. ICSE (2023)
Gabin An, Minhyuk Kwon, Kyunghwa Choi, Jooyong Yi, Shin Yoo
BUGSC++: A Highly Usable Real World Defect Benchmark for C/C++. ASE (2023)
Gabin An, Juyeon Yoon, Thomas Bach, Jingun Hong, Shin Yoo
Just-in-Time Flaky Test Detection via Abstracted Failure Symptom Matching. CoRR (2023)
Jinhan Kim, Gabin An, Robert Feldt, Shin Yoo
Learning Test-Mutant Relationship for Accurate Fault Localisation. CoRR (2023)
Sungmin Kang, Gabin An, Shin Yoo
A Preliminary Evaluation of LLM-Based Fault Localization. CoRR (2023)
Jinhan Kim, Gabin An, Robert Feldt, Shin Yoo
Learning test-mutant relationship for accurate fault localisation. Inf. Softw. Technol. 162 (2023)
William B. Langdon, Vesna Nowack, Justyna Petke, Markus Wagner, Hyeonseok Lee, Erik M. Fredericks, Gabin An, Aymeric Blot
Genetic Improvement @ ICSE 2023. ACM SIGSOFT Softw. Eng. Notes 48 (4) (2023)
Gabin An, Shin Yoo
FDG: a precise measurement of fault diagnosability gain of test cases. ISSTA (2022)
Gabin An, Jingun Hong, Naryeong Kim, Shin Yoo
Fonte: Finding Bug Inducing Commits from Failures. CoRR (2022)
Gabin An, Juyeon Yoon, Jeongju Sohn, Jingun Hong, Dongwon Hwang, Shin Yoo
Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA. ICSE (SEIP) (2022)
Gabin An, Juyeon Yoon, Shin Yoo
Searching for Multi-Fault Programs in Defects4J. CoRR (2021)
Gabin An, Juyeon Yoon, Shin Yoo
Searching for Multi-fault Programs in Defects4J. SSBSE (2021)
Gabin An, Juyeon Yoon, Joyce Jiyoung Whang, Shin Yoo
Improving Test Distance for Failure Clustering with Hypergraph Modelling. CoRR (2021)
Gabin An, Shin Yoo
Human-in-the-Loop Fault Localisation Using Efficient Test Prioritisation of Generated Tests. CoRR (2021)
Gabin An, Shin Yoo
Reducing the search space of bug inducing commits using failure coverage. ESEC/SIGSOFT FSE (2021)
Jeongju Sohn, Gabin An, Jingun Hong, Dongwon Hwang, Shin Yoo
Assisting Bug Report Assignment Using Automated Fault Localisation: An Industrial Case Study. ICST (2021)
Jinhan Kim, Gabin An, Robert Feldt, Shin Yoo
Ahead of Time Mutation Based Fault Localisation using Statistical Inference. ISSRE (2021)
Gabin An, Aymeric Blot, Justyna Petke, Shin Yoo
PyGGI 2.0: language independent genetic improvement framework. ESEC/SIGSOFT FSE (2019)
Jinhan Kim, Gabin An, Robert Feldt, Shin Yoo
Amortising the Cost of Mutation Based Fault Localisation using Statistical Inference. CoRR (2019)
William B. Langdon, Westley Weimer, Christopher Steven Timperley, Oliver Krauss, Zhen Yu Ding, Yiwei Lyu, Nicolas Chausseau, Eric M. Schulte, Shin Hwei Tan, Kevin Leach, Yu Huang, Gabin An
The State and Future of Genetic Improvement. CoRR (2019)
William B. Langdon, Westley Weimer, Christopher Steven Timperley, Oliver Krauss, Zhen Yu Ding, Yiwei Lyu, Nicolas Chausseau, Eric M. Schulte, Shin Hwei Tan, Kevin Leach, Yu Huang, Gabin An
The State and Future of Genetic Improvement. ACM SIGSOFT Softw. Eng. Notes 44 (3) (2019)
Gabin An, Jinhan Kim, Shin Yoo
Comparing line and AST granularity level for program repair using PyGGI. GI@ICSE (2018)