G. Guégan

Publication Activity (10 Years)

Years Active: 2001-2002
Publications (10 Years): 0

Publications

M. Fadlallah, Gérard Ghibaudo, Jalal Jomaah, M. Zoaeter, G. Guégan
Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs. Microelectron. Reliab. 42 (1) (2002)
B. Cretu, Francis Balestra, Gérard Ghibaudo, G. Guégan
Origin of hot carrier degradation in advanced nMOSFET devices. Microelectron. Reliab. 42 (9-11) (2002)
François Lime, Gérard Ghibaudo, G. Guégan
Stress induced leakage current at low field in ultra thin oxides. Microelectron. Reliab. 41 (9-10) (2001)