Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs.
M. FadlallahGérard GhibaudoJalal JomaahM. ZoaeterG. GuéganPublished in: Microelectron. Reliab. (2002)
Keyphrases
- low frequency
- high frequency
- frequency domain
- wavelet transform
- intensity images
- subband
- high frequency components
- wavelet analysis
- low pass
- discrete wavelet transform
- original images
- high resolution
- wavelet coefficients
- electromagnetic fields
- low and high frequency
- contourlet transform
- frequency band
- noise level
- image processing
- spatial domain
- input image
- high quality