G. Giusto

Publication Activity (10 Years)

Years Active: 2003-2005
Publications (10 Years): 0

Publications

G. Ghidini, C. Capolupo, G. Giusto, A. Sebastiani, B. Stragliati, M. E. Vitali
Tunnel oxide degradation under pulsed stress. Microelectron. Reliab. 45 (9-11) (2005)
G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, Andrea Ghetti, N. Galbiati, G. Giusto, A. Garavaglia
Impact of interface and bulk trapped charges on transistor reliability. Microelectron. Reliab. 45 (5-6) (2005)
G. Ghidini, A. Garavaglia, G. Giusto, Andrea Ghetti, R. Bottini, D. Peschiaroli, M. Scaravaggi, F. Cazzaniga, Daniele Ielmini
Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET. Microelectron. Reliab. 43 (8) (2003)