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Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET.
G. Ghidini
A. Garavaglia
G. Giusto
Andrea Ghetti
R. Bottini
D. Peschiaroli
M. Scaravaggi
F. Cazzaniga
Daniele Ielmini
Published in:
Microelectron. Reliab. (2003)
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