F. Wiest

Publication Activity (10 Years)

Years Active: 2005-2005
Publications (10 Years): 0

Publications

V. Capodieci, F. Wiest, T. Sulima, J. Schulze, I. Eisele
as gate dielectric for sub-100nm CMOS and DRAM technology. Microelectron. Reliab. 45 (5-6) (2005)