Eiichi Murakami

Publication Activity (10 Years)

Years Active: 2002-2005
Publications (10 Years): 0

Publications

Hideki Aono, Eiichi Murakami, Kousuke Okuyama, A. Nishida, Masataka Minami, Y. Ooji, Katsuhiko Kubota
Modeling of NBTI saturation effect and its impact on electric field dependence of the lifetime. Microelectron. Reliab. 45 (7-8) (2005)
Eiji Takeda, Eiichi Murakami, Kazuyoshi Torii, Yutaka Okuyama, Eishi Ebe, Kenji Hinode, Shin'ichiro Kimura
Reliability issues of silicon LSIs facing 100-nm technology node. Microelectron. Reliab. 42 (4-5) (2002)