Login / Signup
Modeling of NBTI saturation effect and its impact on electric field dependence of the lifetime.
Hideki Aono
Eiichi Murakami
Kousuke Okuyama
A. Nishida
Masataka Minami
Y. Ooji
Katsuhiko Kubota
Published in:
Microelectron. Reliab. (2005)
Keyphrases
</>
electric field
negative impact
website