E. Bouyssou

Publication Activity (10 Years)

Years Active: 2008-2009
Publications (10 Years): 0

Publications

M. T. Chentir, J.-B. Jullien, B. Valtchanov, E. Bouyssou, L. Ventura, C. Anceau
Percolation theory applied to PZT thin films capacitors breakdown mechanisms. Microelectron. Reliab. 49 (9-11) (2009)
M. Verchiani, E. Bouyssou, G. Fiannaca, F. Cantin, C. Anceau, P. Ranson
Reliability study of TaON capacitors: From leakage current characterization to ESD robustness prediction. Microelectron. Reliab. 48 (8-9) (2008)