Login / Signup
Reliability study of TaON capacitors: From leakage current characterization to ESD robustness prediction.
M. Verchiani
E. Bouyssou
G. Fiannaca
F. Cantin
C. Anceau
P. Ranson
Published in:
Microelectron. Reliab. (2008)
Keyphrases
</>
integrated circuit
neural network
prediction accuracy
low cost
prediction model