Duhyun Jeon

Publication Activity (10 Years)

Years Active: 2015-2023
Publications (10 Years): 3

Top Topics

Cmos Technology

Error Correcting

Top Venues

IEEE J. Solid State Circuits

Publications

Duhyun Jeon, Dongmin Lee, Dong Kyue Kim, Byong-Deok Choi
Physical Unclonable Function Based on Contact Failure Probability With Bit Error Rate < 0.43 ppm After Preselection With 0.0177% Discard Ratio. IEEE J. Solid State Circuits 58 (4) (2023)
Duhyun Jeon, Dongmin Lee, Dong Kyue Kim, Byong-Deok Choi
Contact PUF: Highly Stable Physical Unclonable Functions Based on Contact Failure Probability in 180 nm, 130 nm, and 28 nm CMOS Processes. HOST (2022)
Duhyun Jeon, Jong-Hak Baek, Yong-Duck Kim, Jaeseong Lee, Dong Kyue Kim, Byong-Deok Choi
Based on Contact Formation Probability Without Error Correction Code. IEEE J. Solid State Circuits 55 (3) (2020)
Duhyun Jeon, Jong-Hak Baek, Dong Kyue Kim, Byong-Deok Choi
Towards Zero Bit-Error-Rate Physical Unclonable Function: Mismatch-Based vs. Physical-Based Approaches in Standard CMOS Technology. DSD (2015)