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Towards Zero Bit-Error-Rate Physical Unclonable Function: Mismatch-Based vs. Physical-Based Approaches in Standard CMOS Technology.

Duhyun JeonJong-Hak BaekDong Kyue KimByong-Deok Choi
Published in: DSD (2015)
Keyphrases
  • bit error rate
  • computer simulation
  • cmos technology
  • low power
  • image processing
  • multipath
  • analytical model
  • low voltage