David R. Allee

Publication Activity (10 Years)

Years Active: 1991-2021
Publications (10 Years): 3

Top Topics

Tomographic Images

High Sensitivity

Electrical Engineering

Top Venues

IEEE Trans. Instrum. Meas.

Publications

Zachary D. Drummond, Kevin E. Claytor, David R. Allee, David M. Hull
An Optimized Subspace-Based Approach to Synchrophasor Estimation. IEEE Trans. Instrum. Meas. 70 (2021)
Michael Goryll, Trevor J. Thornton, Chao Wang, Stephen M. Phillips, David R. Allee
Online Undergraduate Laboratories in Electrical Engineering. FIE (2019)
Joseph T. Smith, Eric W. Forsythe, David R. Allee, Jennifer Blain Christen
Adaptive digital x-ray detector for high sensitivity medical fluoroscopy imaging. BioCAS (2015)
Aritra Dey, David R. Allee
Amorphous silicon 5 bit flash analog to digital converter. CICC (2012)
Aritra Dey, David R. Allee
Amorphous silicon current steering digital to analog converter. CICC (2011)
Aritra Dey, Hongjiang Song, Tofayel Ahmed, Sameer M. Venugopal, David R. Allee
Amorphous silicon 7 bit digital to analog converter on PEN. CICC (2010)
Rahul Shringarpure, Lawrence T. Clark, Sameer M. Venugopal, David R. Allee, Shrinivas G. Uppili
Amorphous silicon logic circuits on flexible substrates. CICC (2008)
Kyle R. Wissmiller, Jonathan E. Knudsen, Travis J. Alward, Zi P. Li, David R. Allee, Lawrence T. Clark
Reducing power in flexible a-Si digital circuits while preserving state. CICC (2005)
Mahbub Hasan, David R. Allee, Mohammad Kabir, Kazi Rahman
A 15-bit CMOS cyclic A/D converter with correlated double sampling. ISCAS (1) (2002)
Mahbub Hasan, Huan-Hsiang Patrick Shen, David R. Allee, Michael J. Pennell
A behavioral model of a 1.8-V flash A/D converter based on deviceparameters. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19 (1) (2000)
Stephen Y. Chou, David R. Allee, R. Fabian Pease, James S. Harris Jr
Lateral resonant tunneling transistors employing field-induced quantum wells and barriers. Proc. IEEE 79 (8) (1991)
David R. Allee, Alec N. Broers, R. Fabian W. Pease
Limits of nano-gate fabrication. Proc. IEEE 79 (8) (1991)