Changhua Tan

Publication Activity (10 Years)

Years Active: 2001-2006
Publications (10 Years): 0

Publications

Yao Zhao, Mingzhen Xu, Changhua Tan
Effect of reverse substrate bias on ultra-thin gate oxide n-MOSFET degradation under different stress modes. Microelectron. Reliab. 46 (1) (2006)
Lingfeng Mao, Changhua Tan, Mingzhen Xu
Erratum to "The effect of image potential on electron transmission and electric current in the direct tunneling regime of ultra-thin MOS structures" [Microelectronics Reliability 2001;41: 927-931]. Microelectron. Reliab. 42 (6) (2002)
Fuchen Mu, Mingzhen Xu, Changhua Tan, Xiaorong Duan
Weibull characteristics of n-MOSFET's with ultrathin gate oxides under FN stress and lifetime prediction. Microelectron. Reliab. 42 (6) (2002)
Lingfeng Mao, Heqiu Zhang, Changhua Tan, Mingzhen Xu
The effect of transition region on the direct tunneling current and Fowler-Nordheim tunneling current oscillations in ultrathin MOS structures. Microelectron. Reliab. 42 (2) (2002)
Lingfeng Mao, Changhua Tan, Mingzhen Xu
The effect of image potential on electron transmission and electric current in the direct tunneling regime of ultra-thin MOS structures. Microelectron. Reliab. 41 (6) (2001)
Fuchen Mu, Mingzhen Xu, Changhua Tan, Xiaorong Duan
. Microelectron. Reliab. 41 (11) (2001)
Lingfeng Mao, Yao Yang, Jian-Lin Wei, Heqiu Zhang, Mingzhen Xu, Changhua Tan
/Si interface roughness on gate current. Microelectron. Reliab. 41 (11) (2001)
Fuchen Mu, Changhua Tan, Mingzhen Xu
Proportional difference estimate method of determining characteristic parameters of normal and log-normal distributions. Microelectron. Reliab. 41 (1) (2001)