Erratum to "The effect of image potential on electron transmission and electric current in the direct tunneling regime of ultra-thin MOS structures" [Microelectronics Reliability 2001;41: 927-931].
Lingfeng MaoChanghua TanMingzhen XuPublished in: Microelectron. Reliab. (2002)
Keyphrases
- image analysis
- single image
- input image
- image classification
- image data
- image content
- image structure
- image retrieval
- image features
- image segmentation
- template matching
- multiscale
- image collections
- image representation
- low level
- region of interest
- image matching
- similarity measure
- hough transform
- segmentation method
- feature vectors
- data transmission
- electron microscope