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Weibull characteristics of n-MOSFET's with ultrathin gate oxides under FN stress and lifetime prediction.

Fuchen MuMingzhen XuChanghua TanXiaorong Duan
Published in: Microelectron. Reliab. (2002)
Keyphrases
  • prediction accuracy
  • prediction model
  • prediction algorithm
  • case study
  • database
  • data sets
  • expert systems
  • long term
  • markov chain
  • field effect transistors