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C. Ali
Publication Activity (10 Years)
Years Active: 2002-2005
Publications (10 Years): 0
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Publications
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F. Sibileau
,
C. Ali
,
C. Giret
,
D. Faure
SRAM cell defect isolation methodology by sub micron probing technique.
Microelectron. Reliab.
45 (9-11) (2005)
C. Ali
,
C. Charpentier
Fail / recover / fail (F/R/F) failure mechanisms new trend.
Microelectron. Reliab.
44 (9-11) (2004)
D. Faure
,
D. Bru
,
C. Ali
,
C. Giret
,
K. Christensen
Gate oxide breakdown characterization on 0.13mum CMOS technology.
Microelectron. Reliab.
43 (9-11) (2003)
C. Giret
,
D. Bru
,
D. Faure
,
C. Ali
,
M. Razani
,
D. Gobled
Electrical characteristics measurement of transistors by 4 tips-0.2 micron probing technique in Semiconductor Failure Analysis.
Microelectron. Reliab.
42 (9-11) (2002)