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M. Razani
Publication Activity (10 Years)
Years Active: 2002-2002
Publications (10 Years): 0
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Publications
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C. Giret
,
D. Bru
,
D. Faure
,
C. Ali
,
M. Razani
,
D. Gobled
Electrical characteristics measurement of transistors by 4 tips-0.2 micron probing technique in Semiconductor Failure Analysis.
Microelectron. Reliab.
42 (9-11) (2002)