Baris Arslan

Publication Activity (10 Years)

Years Active: 2002-2022
Publications (10 Years): 4

Top Topics

Diagnostic Tests

Component Failures

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Bekir Zahit Demiray, Baris Arslan
Test Cost-Test Quality Modeling For Adaptive Test. AQTR (2022)
Baris Arslan, Alex Orailoglu
Power-Aware Delay Test Quality Optimization for Multiple Frequency Domains. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35 (1) (2016)
Baris Arslan
Small delay defect diagnosis through failure observation ordering. AQTR (2016)
Baris Arslan, Alex Orailoglu
Aggressive Test Cost Reductions Through Continuous Test Effectiveness Assessment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35 (12) (2016)
Baris Arslan, Alex Orailoglu
Tracing the best test mix through multi-variate quality tracking. VTS (2013)
Baris Arslan, Alex Orailoglu
Full exploitation of process variation space for continuous delivery of optimal delay test quality. ASP-DAC (2013)
Baris Arslan, Alex Orailoglu
Delay test resource allocation and scheduling for multiple frequency domains. VTS (2012)
Baris Arslan, Alex Orailoglu
Adaptive Test Framework for Achieving Target Test Quality at Minimal Cost. Asian Test Symposium (2011)
Baris Arslan, Alex Orailoglu
Adaptive test optimization through real time learning of test effectiveness. DATE (2011)
Baris Arslan, Alex Orailoglu
Delay test quality maximization through process-aware selection of test set size. ICCD (2010)
Baris Arslan, Ozgur Sinanoglu, Alex Orailoglu
Extending the Applicability of Parallel-Serial Scan Designs. ICCD (2004)
Baris Arslan, Alex Orailoglu
CircularScan: A Scan Architecture for Test Cost Reduction. DATE (2004)
Baris Arslan, Alex Orailoglu
Test Cost Reduction Through A Reconfigurable Scan Architecture. ITC (2004)
Baris Arslan, Alex Orailoglu
Design space exploration for aggressive test cost reduction in CircularScan architectures. ICCAD (2004)
Baris Arslan, Alex Orailoglu
Extracting Precise Diagnosis of Bridging Faults from Stuck-at Fault Information. Asian Test Symposium (2003)
Baris Arslan, Alex Orailoglu
Fault Dictionary Size Reduction through Test Response Superposition. ICCD (2002)