Alain Hoffmann

Publication Activity (10 Years)

Years Active: 2007-2017
Publications (10 Years): 2

Top Topics

Chance Discovery

Wavelet Transform

Top Venues

Microelectron. Reliab.

Publications

Marcelino Seif, Fabien Pascal, Bruno Sagnes, J. Elbeyrouthy, Alain Hoffmann, Sébastien Haendler, Pascal Chevalier, Daniel Gloria
Characterization, modeling and comparison of 1/f noise in Si/SiGe: C HBTs issued from three advanced BiCMOS technologies. ICM (2017)
Alfredo Arnaud, Alain Hoffmann
A complete compact model for flicker noise in MOS transistors. LASCAS (2015)
Marcelino Seif, Fabien Pascal, Bruno Sagnes, Alain Hoffmann, Sébastien Haendler, Pascal Chevalier, Daniel Gloria
Study of low frequency noise in advanced SiGe: C heterojunction bipolar transistors. ESSDERC (2014)
Marcelino Seif, Fabien Pascal, Bruno Sagnes, Alain Hoffmann, Sébastien Haendler, Pascal Chevalier, Daniel Gloria
Dispersion study of DC and Low Frequency Noise in SiGe: C Heterojunction Bipolar Transistors used for mm-Wave to Terahertz applications. Microelectron. Reliab. 54 (9-10) (2014)
Cédric Leyris, Frédéric Martinez, M. Valenza, Alain Hoffmann, J. C. Vildeuil
Random telegraph signal: A sensitive and nondestructive tool for gate oxide single trap characterization. Microelectron. Reliab. 47 (4-5) (2007)
Cédric Leyris, Frédéric Martinez, Alain Hoffmann, M. Valenza, J. C. Vildeuil
N-MOSFET oxide trap characterization induced by nitridation process using RTS noise analysis. Microelectron. Reliab. 47 (1) (2007)