TESTING PROCESS
Experts
- Tsong Yueh Chen
- Gordon Fraser
- Lionel C. Briand
- Gregg Rothermel
- Krishnendu Chakrabarty
- Vahid Garousi
- T. H. Tse
- Robert M. Hierons
- Andrea Arcuri
- Mark Harman
- Atif M. Memon
- Kai-Yuan Cai
- Antonia Bertolino
- José Carlos Maldonado
- Tao Xie
- Rudolf Ramler
- Michael Felderer
- W. K. Chan
- Dave Towey
- Jinfu Chen
- Yves Le Traon
- Matteo Sonza Reorda
- Zhenyu Chen
- Bernhard K. Aichernig
- Arnaud Gotlieb
- Andy Zaidman
- Hong Zhu
- Luiz Fernando Capretz
- Hyunsook Do
- Jeff Offutt
- Bruno Legeard
- Baowen Xu
- Paolo Tonella
- Mary Jean Harrold
- Inmaculada Medina-Bulo
- Robert Feldt
- Wasif Afzal
- Dan Hao
- Song Huang
Venues
- CoRR
- ICST
- ITC
- ICST Workshops
- Softw. Test. Verification Reliab.
- IEEE Trans. Software Eng.
- J. Syst. Softw.
- Inf. Softw. Technol.
- ICSE
- ISSTA
- COMPSAC
- ASE
- ACM SIGSOFT Softw. Eng. Notes
- Softw. Qual. J.
- ISSRE
- SEKE
- QSIC
- ESEC/SIGSOFT FSE
- AST
- Asian Test Symposium
- SAC
- IEEE Access
- ACM Trans. Softw. Eng. Methodol.
- Empir. Softw. Eng.
- ICSM
- Int. J. Softw. Eng. Knowl. Eng.
- IEEE Softw.
- VTS
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- AST@ICSE
- DATE
- QRS Companion
- APSEC
- SBES
- ICTSS
- ISSRE Workshops
- J. Electron. Test.
- SAST
- QRS
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