TESTING PROCESS
Experts
- Tsong Yueh Chen
- Gordon Fraser
- Lionel C. Briand
- Gregg Rothermel
- Krishnendu Chakrabarty
- Vahid Garousi
- T. H. Tse
- Robert M. Hierons
- Atif M. Memon
- Mark Harman
- Andrea Arcuri
- Kai-Yuan Cai
- José Carlos Maldonado
- Antonia Bertolino
- Tao Xie
- Rudolf Ramler
- W. K. Chan
- Michael Felderer
- Dave Towey
- Yves Le Traon
- Jinfu Chen
- Bernhard K. Aichernig
- Matteo Sonza Reorda
- Zhenyu Chen
- Andy Zaidman
- Arnaud Gotlieb
- Hyunsook Do
- Hong Zhu
- Luiz Fernando Capretz
- Mary Jean Harrold
- Jeff Offutt
- Robert Feldt
- Wasif Afzal
- Paolo Tonella
- Inmaculada Medina-Bulo
- Baowen Xu
- Dan Hao
- Bruno Legeard
- Shaukat Ali
Venues
- CoRR
- ICST
- ITC
- ICST Workshops
- Softw. Test. Verification Reliab.
- IEEE Trans. Software Eng.
- J. Syst. Softw.
- Inf. Softw. Technol.
- ICSE
- ISSTA
- COMPSAC
- ASE
- ACM SIGSOFT Softw. Eng. Notes
- Softw. Qual. J.
- ISSRE
- SEKE
- QSIC
- ESEC/SIGSOFT FSE
- AST
- Asian Test Symposium
- IEEE Access
- SAC
- Empir. Softw. Eng.
- ACM Trans. Softw. Eng. Methodol.
- ICSM
- IEEE Softw.
- Int. J. Softw. Eng. Knowl. Eng.
- VTS
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- DATE
- AST@ICSE
- QRS Companion
- APSEC
- SBES
- ICTSS
- J. Electron. Test.
- ISSRE Workshops
- SAST
- IEEE Trans. Computers
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