TEST SET
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Krishnendu Chakrabarty
- Tsong Yueh Chen
- Lionel C. Briand
- Zhangyang Wang
- Gordon Fraser
- Janusz Rajski
- Robert M. Hierons
- Gregg Rothermel
- Fabrizio Lombardi
- Atif M. Memon
- Hermann Ney
- Seiji Kajihara
- Suparat Niwitpong
- T. H. Tse
- Kewal K. Saluja
- Masashi Sugiyama
- Tianlong Chen
- Paolo Tonella
- Sa-Aat Niwitpong
- Dimitris Nikolos
- Matteo Sonza Reorda
- Antonia Bertolino
- Vishwani D. Agrawal
- Haizhou Li
- Andrea Arcuri
- Jinfu Chen
- Arnaud Gotlieb
- Walter Krämer
- Franz Wotawa
- Edward J. McCluskey
- Xrysovalantis Kavousianos
- Clément L. Canonne
- Dave Towey
- Rubing Huang
- Sandeep K. Gupta
- M. Emre Celebi
- Baowen Xu
Venues
- CoRR
- LREC
- ITC
- ICASSP
- INTERSPEECH
- IEEE Access
- DAGM-Symposium
- ICML
- NeurIPS
- IJCNN
- Datenschutz und Datensicherheit
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- AAAI
- Sensors
- Bildverarbeitung für die Medizin
- ICLR
- ICST
- IEEE Trans. Software Eng.
- Autom.
- ICST Workshops
- GI Jahrestagung
- Asian Test Symposium
- VTS
- IEEE Trans. Computers
- CVPR
- LOG IN
- Elektron. Rechenanlagen
- HMD Prax. Wirtsch.
- Wirtschaftsinf.
- J. Electron. Test.
- Inf. Softw. Technol.
- Commun. Stat. Simul. Comput.
- GI-Jahrestagung
- EMBC
- DATE
- Neurocomputing
- IEEE Trans. Commun.
- Künstliche Intell.
- Computing
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend