TEST DATA GENERATION
Experts
- Tsong Yueh Chen
- Gordon Fraser
- Irith Pomeranz
- Corina S. Pasareanu
- Andrea Arcuri
- Mark Harman
- Sudhakar M. Reddy
- Lionel C. Briand
- Sarfraz Khurshid
- Gregg Rothermel
- T. H. Tse
- Cristian Cadar
- Tao Xie
- Annibale Panichella
- Antonia Bertolino
- Nikolai Tillmann
- Phil McMinn
- Kai-Yuan Cai
- Krishnendu Chakrabarty
- Arnaud Gotlieb
- Vahid Garousi
- Matteo Sonza Reorda
- Rudolf Ramler
- Atif M. Memon
- Bernhard K. Aichernig
- Willem Visser
- José Carlos Maldonado
- Paolo Tonella
- Gregory Gay
- Zhenyu Chen
- Robert M. Hierons
- Mary Jean Harrold
- W. K. Chan
- Shaukat Ali
- Zhenbang Chen
- Robert Feldt
- Vishwani D. Agrawal
- Yves Le Traon
- Giovanni Denaro
Venues
- CoRR
- ITC
- ICST
- ICST Workshops
- IEEE Trans. Software Eng.
- ASE
- ISSTA
- Softw. Test. Verification Reliab.
- Inf. Softw. Technol.
- ICSE
- J. Syst. Softw.
- ACM SIGSOFT Softw. Eng. Notes
- SEKE
- COMPSAC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- VTS
- QSIC
- ISSRE
- Softw. Qual. J.
- AST
- ESEC/SIGSOFT FSE
- Asian Test Symposium
- IEEE Access
- ACM Trans. Softw. Eng. Methodol.
- APSEC
- J. Electron. Test.
- SSBSE
- QRS Companion
- DATE
- DAC
- QRS
- ICSM
- AST@ICSE
- SAC
- GECCO
- Int. J. Softw. Eng. Knowl. Eng.
- VLSI Design
- Empir. Softw. Eng.
- SAST
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend