SURFACE SHAPE
Experts
- Edwin R. Hancock
- Katsushi Ikeuchi
- Imari Sato
- Yoichi Sato
- Daisuke Miyazaki
- Paul E. Debevec
- Shree K. Nayar
- Jörg Peters
- Jianguang Wen
- Helmut Pottmann
- Jan J. Koenderink
- Ko Nishino
- Yasuyuki Matsushita
- Qiang Liu
- Wenping Wang
- Roberto Cipolla
- Hossein Ragheb
- William A. P. Smith
- Yinqiang Zheng
- Pieter Peers
- Todd E. Zickler
- Ignas Budvytis
- Qing Xiao
- Dongqin You
- Melvyn L. Smith
- Yuji Iwahori
- Gang Hu
- Abhinav Gupta
- Qinhuo Liu
- Jean-Louis Roujean
- Stefanos Zafeiriou
- Kestutis Karciauskas
- Osamu Ikeda
- Johannes Wallner
- Ruigang Yang
- Bernhard Preim
- Junyu Dong
- Michael J. Black
- Shinsaku Hiura
Venues
- CoRR
- CVPR
- Remote. Sens.
- IGARSS
- Sensors
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- ICRA
- ACM Trans. Graph.
- Comput. Aided Geom. Des.
- Comput. Aided Des.
- IEEE Access
- Comput. Graph.
- IROS
- Int. J. Comput. Vis.
- Comput. Graph. Forum
- IEEE Trans. Instrum. Meas.
- IEEE Geosci. Remote. Sens. Lett.
- ICIP
- MVA
- IEEE Trans. Image Process.
- BMVC
- Pattern Recognit.
- Comput. Vis. Image Underst.
- Systems and Computers in Japan
- Vis. Comput.
- Int. J. Appl. Earth Obs. Geoinformation
- IEEE Trans. Vis. Comput. Graph.
- Appl. Math. Comput.
- Image Vis. Comput.
- ICPR (1)
- IEEE Robotics Autom. Lett.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- J. Comput. Phys.
- NEMS
- J. Comput. Appl. Math.
- ICASSP
- Int. J. Autom. Technol.
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