SURFACE DEFECTS
Experts
- Daniel F. García
- Rubén Usamentiaga
- Yunhui Yan
- Kechen Song
- Qiwu Luo
- Julio Molleda
- Xuewu Zhang
- Chunhua Yang
- Francisco G. Bulnes
- Kun Liu
- Haiyong Chen
- Chih-Yang Lin
- Olli Silvén
- Menghui Niu
- Roland T. Chin
- Kui Yuan
- Jukka Iivarinen
- Choon-Woo Kim
- Georgios Karakonstantis
- Wenyong Yu
- Xu Zhang
- Franz Pernkopf
- Juhani Rauhamaa
- Xiaoxin Fang
- Lev Mukhanov
- Antti J. Koivo
- Umar Ibrahim Minhas
- Peng Chen
- Jiaojiao Su
- Matti Pietikäinen
- Yibin Huang
- Roger F. Woods
- Hans Vandierendonck
- Xue Wang
- Bing Wang
- Rahul Pandita
- Jun Zhang
- Fityanul Akhyar
- Jorge L. C. Sanz
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Access
- MVA
- Expert Syst. Appl.
- ICRA
- J. Intell. Manuf.
- Microelectron. Reliab.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Electron. Agric.
- Mach. Vis. Appl.
- Multim. Tools Appl.
- Image Vis. Comput.
- BMVC
- J. Intell. Fuzzy Syst.
- Comput. Ind.
- IEEE Trans. Intell. Transp. Syst.
- IEEE Trans. Ind. Informatics
- IEEE Trans Autom. Sci. Eng.
- J. Real Time Image Process.
- ICIP
- DAC
- ICIA
- ICAC
- Microprocess. Microsystems
- J. Electronic Imaging
- CASE
- Signal Image Video Process.
- Frontiers Neurorobotics
- ICCAD
- Int. J. Autom. Technol.
- Neural Comput. Appl.
- EURASIP J. Image Video Process.
- IAS
- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Trans. Syst. Man Cybern.
- Prod. Eng.
- ICIRA (2)
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend