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Experts
- Edwin R. Hancock
- Katsushi Ikeuchi
- Shree K. Nayar
- Kwan-Yee Kenneth Wong
- Aly A. Farag
- Yuji Iwahori
- Philip L. Worthington
- Miaomiao Liu
- Jingyi Yu
- Mathias Ziebarth
- Takashi Matsuyama
- Toshikazu Wada
- Hiroyuki Ukida
- Pieter Peers
- Narendra Ahuja
- Imari Sato
- Roberto Mecca
- Ramesh Raskar
- Ravi Ramamoorthi
- Adrien Bartoli
- Andrew Blake
- Tetsuo Miyake
- Hossein Ragheb
- Jürgen Beyerer
- Kunio Kasugai
- Hans-Peter Seidel
- Fredric Solomon
- Ko Nishino
- Minh Nguyen
- Arpita Dawda
- Yoichi Sato
- Zhenwen Dai
- Hongdong Li
- Paul E. Debevec
- Ryszard Kozera
- Alfred M. Bruckstein
- Junxuan Li
- Ying He
- Hideo Saito
Venues
- CoRR
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- IEEE Trans. Pattern Anal. Mach. Intell.
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- IEEE Trans. Vis. Comput. Graph.
- Pattern Recognit.
- Image Vis. Comput.
- IEEE Geosci. Remote. Sens. Lett.
- Comput. Graph. Forum
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- ICPR (1)
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- Pattern Recognit. Lett.
- SMC
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- ICIAR
- Systems and Computers in Japan
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- WACV
- Comput. Graph.
- ICIA
- IJCAI
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