SPECULAR HIGHLIGHTS
Experts
- Katsushi Ikeuchi
- Roberto Cipolla
- Ramesh Raskar
- Edwin R. Hancock
- Sunil Hadap
- Takahiro Okabe
- Li-Wen Wang
- Chu-Tak Li
- Shinsaku Hiura
- Imari Sato
- Zhi-Song Liu
- Yoichi Sato
- Maria Petrou
- Xiaochun Cao
- Ko Nishino
- Hans-Peter Seidel
- Fredric Solomon
- Matthew A. Turk
- Philippe Bekaert
- Rogério Schmidt Feris
- Motoharu Matsuura
- Yuji Iwahori
- Yueping Cai
- Andrew Blake
- Nelson L. Max
- Eiji Oki
- David J. Kriegman
- Tetsuya Miki
- Junyu Dong
- Tongbo Chen
- Michael S. Langer
- Mubarak Shah
- Naoto Kishi
- Sabine Süsstrunk
- Shree K. Nayar
- Pauli Fält
- Kosuke Sato
- Kar-Han Tan
- Ryszard Kozera
Venues
- CoRR
- CVPR
- Sensors
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Graph. Forum
- ICRA
- Remote. Sens.
- Mach. Vis. Appl.
- Vis. Comput.
- MVA
- IEEE Access
- ICPR (1)
- OFC
- ICIP
- Comput. Vis. Image Underst.
- CVPR Workshops
- ICPR
- Comput. Graph.
- WACV
- IEICE Electron. Express
- Int. J. Comput. Vis.
- IEEE Visualization
- Multim. Tools Appl.
- Color Imaging Conference
- CVPR (2)
- ACM Trans. Graph.
- IEICE Trans. Electron.
- SIGGRAPH Posters
- CIC
- ICTON
- IEEE Trans. Image Process.
- VISAPP (1)
- 3DV
- EMBC
- IROS
- IEEE Trans. Vis. Comput. Graph.
- CVPR (1)
- Displays
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend