SHAPE RECOVERY
Experts
- Edwin R. Hancock
- William A. P. Smith
- Hans-Peter Seidel
- Roberto Cipolla
- Aly A. Farag
- Katsushi Ikeuchi
- Tae-Sun Choi
- Shunlin Liang
- Ko Nishino
- Jianguang Wen
- Wenqi Ren
- Christian Theobalt
- Michael Breuß
- Yuji Iwahori
- Imari Sato
- Luc Van Gool
- William T. Freeman
- Boxin Shi
- Yasuyuki Matsushita
- Mario Castelán
- Ravi Ramamoorthi
- Marc Pollefeys
- Xin Tong
- Shaodi You
- Cong Wang
- Hong Qin
- Qing Xiao
- Shree K. Nayar
- Daniel Cohen-Or
- Miaomiao Liu
- Philip L. Worthington
- Robby T. Tan
- Jean-Denis Durou
- Tobias Ritschel
- Kwan-Yee Kenneth Wong
- Dongqin You
- Zhengguo Li
- Deyu Meng
- Ruigang Yang
Venues
- CoRR
- CVPR
- Sensors
- ICCV
- Remote. Sens.
- ICIP
- IGARSS
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Access
- Comput. Graph. Forum
- ACM Trans. Graph.
- IEEE Trans. Image Process.
- IEEE Trans. Geosci. Remote. Sens.
- BMVC
- ICASSP
- Pattern Recognit.
- Multim. Tools Appl.
- ICRA
- Vis. Comput.
- ICPR
- Comput. Graph.
- Int. J. Comput. Vis.
- CVPR Workshops
- Comput. Vis. Image Underst.
- IEEE Geosci. Remote. Sens. Lett.
- Image Vis. Comput.
- MVA
- IROS
- WACV
- Comput. Aided Des.
- J. Vis. Commun. Image Represent.
- Neurocomputing
- IET Image Process.
- Pattern Recognit. Lett.
- IEEE Trans. Multim.
- 3DV
- IEEE Signal Process. Lett.
- IEEE Trans. Vis. Comput. Graph.
- IEEE Trans. Instrum. Meas.
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