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Experts
- Junya Sekikawa
- Takayoshi Kubono
- George J. Papaioannou
- Antti Pinomaa
- Pasi Nuutinen
- Robert Weigel
- Francisco Javier De Moure-Flores
- Tero Kaipia
- A. A. Dakhel
- Ri-Qing Lv
- Yong Zhao
- Pertti Silventoinen
- Carlos Rinaldi
- Yasuhiro Matsumoto
- Masayuki Yamato
- Loukas Michalas
- Wilfrid Claeys
- Andrea Cattaneo
- Jose Santos-Cruz
- Paul A. Bottomley
- Yoshikatsu Akiyama
- Mohamed Ghorbel
- Ana Collado
- Matroni Koutsoureli
- Venkateswarlu Gaddam
- Diego Mateo
- Robert Plana
- Kang-Yoon Lee
- Stefan Dilhaire
- Roman Szewczyk
- Juha-Pekka Ström
- Markus Zahn
- E. Papandreou
- Shailesh Singh Chouhan
- Ergin Atalar
- Yue Hao
- Apostolos Georgiadis
- Josep Altet
- María de la Luz Olvera-Amador
Venues
- Microelectron. Reliab.
- IEEE Trans. Instrum. Meas.
- Microelectron. J.
- Sensors
- IEEE Access
- IEICE Trans. Electron.
- NEMS
- IEEE SENSORS
- CCE
- ISCAS
- ICECS
- J. Vis.
- IEEE Trans. Ind. Electron.
- Symmetry
- EMBC
- Sci. China Inf. Sci.
- CoRR
- IECON
- RWS
- IBM J. Res. Dev.
- ICTON
- IEEE Trans. Smart Grid
- IRPS
- J. Sensors
- IEEE Trans. Circuits Syst. I Regul. Pap.
- ICMENS
- LASCAS
- ESSDERC
- Int. J. Bifurc. Chaos
- Entropy
- AUTOMATION
- VLSI Design
- IEEE J. Solid State Circuits
- MWSCAS
- MHS
- ISOCC
- 3DIC
- IEEE Trans. Circuits Syst. II Express Briefs
- ISSCC
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