REGRESSION TESTING
Experts
- Gordon Fraser
- Tsong Yueh Chen
- Lionel C. Briand
- Gregg Rothermel
- T. H. Tse
- Andrea Arcuri
- Hyunsook Do
- Irith Pomeranz
- Mary Jean Harrold
- Atif M. Memon
- Antonia Bertolino
- Vahid Garousi
- Robert M. Hierons
- Mark Harman
- Tao Xie
- Kai-Yuan Cai
- Yvan Labiche
- Zhenyu Chen
- Michael Felderer
- Sudhakar M. Reddy
- W. K. Chan
- Jinfu Chen
- Dave Towey
- Rudolf Ramler
- Dan Hao
- Rubing Huang
- Lu Zhang
- Dusica Marijan
- Lingming Zhang
- Durga Prasad Mohapatra
- Arnaud Gotlieb
- Yves Le Traon
- José Carlos Maldonado
- Sebastian G. Elbaum
- Myra B. Cohen
- Wasif Afzal
- Alessandro Orso
- Baowen Xu
- Andy Zaidman
Venues
- CoRR
- ICSM
- ICST
- IEEE Trans. Software Eng.
- ICST Workshops
- J. Syst. Softw.
- Inf. Softw. Technol.
- ACM SIGSOFT Softw. Eng. Notes
- Softw. Test. Verification Reliab.
- ICSE
- ITC
- ISSTA
- SEKE
- COMPSAC
- J. Softw. Maintenance Res. Pract.
- ASE
- ISSRE
- Softw. Qual. J.
- APSEC
- Empir. Softw. Eng.
- IEEE Access
- QSIC
- CSMR
- Int. J. Softw. Eng. Knowl. Eng.
- IEEE Softw.
- SAC
- QRS Companion
- ESEC/SIGSOFT FSE
- ACM Trans. Softw. Eng. Methodol.
- AST
- VTS
- ICSME
- Asian Test Symposium
- AST@ICSE
- Software Engineering Research and Practice
- SAST
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ICTSS
- SIGSOFT FSE
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