REFLECTANCE PROPERTIES
Experts
- Paul E. Debevec
- Yasuyuki Matsushita
- Katsushi Ikeuchi
- Roberto Mecca
- Edwin R. Hancock
- Ko Nishino
- Roberto Cipolla
- Boxin Shi
- Imari Sato
- Pieter Peers
- Hans-Peter Seidel
- Yoichi Sato
- Abhijeet Ghosh
- Takahiro Okabe
- Ravi Ramamoorthi
- Daniel Cremers
- Yvain Quéau
- William A. P. Smith
- Melvyn L. Smith
- Graham Fyffe
- Junyu Dong
- Ignas Budvytis
- Shree K. Nayar
- David J. Kriegman
- Jianguang Wen
- Narendra Ahuja
- Luc Van Gool
- Jonathan T. Barron
- Norimichi Tsumura
- Michael Breuß
- Lyndon N. Smith
- Osamu Ikeda
- Alfred M. Bruckstein
- Jean-Denis Durou
- George Drettakis
- Shunlin Liang
- Qinhuo Liu
- Maria Petrou
- Xin Tong
Venues
- CoRR
- CVPR
- Remote. Sens.
- Comput. Graph. Forum
- IGARSS
- IEEE Trans. Pattern Anal. Mach. Intell.
- ACM Trans. Graph.
- ICCV
- IEEE Trans. Geosci. Remote. Sens.
- Sensors
- ICIP
- Int. J. Comput. Vis.
- Rendering Techniques
- BMVC
- ICRA
- IEEE Trans. Vis. Comput. Graph.
- 3DV
- IEEE Geosci. Remote. Sens. Lett.
- Vis. Comput.
- Comput. Graph.
- IEEE Trans. Instrum. Meas.
- SIGGRAPH
- IROS
- Comput. Vis. Image Underst.
- IEEE Trans. Image Process.
- IEEE Access
- Image Vis. Comput.
- MVA
- Color Imaging Conference
- ICPR
- SIGGRAPH Posters
- OFC
- WACV
- SIGGRAPH Talks
- CIC
- ICCP
- Mach. Vis. Appl.
- Pattern Recognit.
- IEEE Computer Graphics and Applications
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