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Experts
- Tomás Pajdla
- Daniel Barath
- Zuzana Kukelova
- João Pedro Barreto
- Peter F. Sturm
- Martin Bujnak
- Yisong Chen
- Ezio Malis
- Tamás Szirányi
- Nassir Navab
- Ralph Ewerth
- Zhanyi Hu
- Richard I. Hartley
- Zoltan Kato
- Chandra Kambhamettu
- Edmond Boyer
- Amnon Shashua
- Camillo J. Taylor
- Wolfgang Förstner
- Mubarak Shah
- Gilles Simon
- Danda Pani Paudel
- Sanjeev J. Koppal
- Laszlo Havasi
- Sudipta N. Sinha
- Slobodan Ilic
- Horace Ho-Shing Ip
- Hassan Foroosh
- Marc Pollefeys
- Anders Heyden
- Yuncai Liu
- Zoltán Szlávik
- Hongbin Zha
- Derek A. Paley
- Marie-Odile Berger
- Javier-Flavio Vigueras
- Xianghua Ying
- Guanghui Wang
- Michal Polic
Venues
- CoRR
- CVPR
- IROS
- ICCV
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICRA
- Pattern Recognit.
- IEEE Trans. Image Process.
- ICPR
- IEEE Access
- BMVC
- CVPR (1)
- MVA
- Pattern Recognit. Lett.
- IEEE Trans. Autom. Control.
- J. Electronic Imaging
- ICPR (1)
- Mach. Vis. Appl.
- WACV
- Sensors
- Int. J. Comput. Vis.
- ECCV (2)
- IGARSS
- CVPR Workshops
- IEEE Trans. Instrum. Meas.
- AVSS
- 3DV
- Discret. Math.
- IEEE Trans. Circuits Syst. Video Technol.
- J. Robotics Mechatronics
- IEEE Robotics Autom. Lett.
- ECCV (1)
- Remote. Sens.
- MICAI
- Graph. Model.
- Comput. Vis. Image Underst.
- ARK
- Signal Process.
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