PLANAR SCENES
Experts
- Tomás Pajdla
- Daniel Barath
- Zuzana Kukelova
- Ralph Ewerth
- Peter F. Sturm
- João Pedro Barreto
- Yisong Chen
- Tamás Szirányi
- Ezio Malis
- Nassir Navab
- Zhanyi Hu
- Martin Bujnak
- Hongbin Zha
- Michal Polic
- Richard I. Hartley
- Marc Pollefeys
- Camillo J. Taylor
- Mubarak Shah
- Javier-Flavio Vigueras
- Yuncai Liu
- Derek A. Paley
- Slobodan Ilic
- Amnon Shashua
- Danda Pani Paudel
- Zoltán Szlávik
- Edmond Boyer
- Hassan Foroosh
- Gilles Simon
- Horace Ho-Shing Ip
- Zoltan Kato
- Sanjeev J. Koppal
- Sudipta N. Sinha
- Chandra Kambhamettu
- Marie-Odile Berger
- Guanghui Wang
- Wolfgang Förstner
- Laszlo Havasi
- Xianghua Ying
- Anders Heyden
Venues
- CoRR
- CVPR
- IROS
- ICCV
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICRA
- Pattern Recognit.
- IEEE Trans. Image Process.
- ICPR
- BMVC
- IEEE Access
- Pattern Recognit. Lett.
- Sensors
- MVA
- J. Electronic Imaging
- Int. J. Comput. Vis.
- CVPR (1)
- IEEE Trans. Autom. Control.
- ICPR (1)
- Mach. Vis. Appl.
- WACV
- 3DV
- IGARSS
- AVSS
- ECCV (2)
- IEEE Trans. Instrum. Meas.
- CVPR Workshops
- J. Robotics Mechatronics
- Discret. Math.
- IEEE Trans. Circuits Syst. Video Technol.
- ECCV (1)
- IEEE Robotics Autom. Lett.
- Remote. Sens.
- Comput. Vis. Graph. Image Process.
- ICCV Workshops
- Signal Process.
- EMBC
- Comput. Vis. Image Underst.
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