PHOTOMETRIC PROPERTIES
Experts
- Jan J. Koenderink
- Edwin R. Hancock
- Kristin J. Dana
- Naoki Asada
- Rahul Sawhney
- Xiaojuan Qi
- Fuxin Li
- Zhengzhe Liu
- Shree K. Nayar
- Yizhou Yu
- Paul E. Debevec
- Henrik I. Christensen
- Jiaya Jia
- Abhinav Gupta
- Renjie Liao
- Raquel Urtasun
- Corinna Kofler
- Sameh Khamis
- Tamal K. Dey
- Medeni Soysal
- Yuke Zhu
- Jussi Keppo
- Jonathan Tremblay
- Maria Shugrina
- Kangxue Yin
- Krishna Murthy Jatavallabhula
- Tien Do
- Jia-Wei Liu
- Monique Teillaud
- Masashi Baba
- Ramesh Raskar
- Hisanaga Fujiwara
- Minsu Cho
- Rong Lu
- Khiem Vuong
- Joshua M. Susskind
- Stan Birchfield
- Fariborz Taherkhani
- Gunter Spöck
Venues
- CoRR
- CVPR
- ICCV
- Comput. Aided Geom. Des.
- ICRA
- Comput. Graph. Forum
- IEEE Trans. Pattern Anal. Mach. Intell.
- ACM Trans. Graph.
- Discret. Comput. Geom.
- Vis. Comput.
- WACV
- ICIP
- IEEE Trans. Vis. Comput. Graph.
- Int. J. Comput. Vis.
- 3DV
- Sensors
- Comput. Vis. Image Underst.
- Pattern Recognit. Lett.
- SIGGRAPH Posters
- Image Vis. Comput.
- Graph. Model.
- IEEE Trans. Image Process.
- IEEE Access
- CVPR Workshops
- Comput. Aided Des.
- J. Math. Imaging Vis.
- ICLR
- Rendering Techniques
- J. Comb. Theory, Ser. B
- Ars Comb.
- Discret. Math.
- IGARSS
- IEEE Trans. Geosci. Remote. Sens.
- SCG
- BMVC
- SIGGRAPH
- Graphs Comb.
- COLT
- ICIAR
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