PHOTOMETRIC PROPERTIES
Experts
- Naoki Asada
- Jan J. Koenderink
- Kristin J. Dana
- Edwin R. Hancock
- Raquel Urtasun
- Abhinav Gupta
- Jiaya Jia
- Henrik I. Christensen
- Renjie Liao
- Xiaojuan Qi
- Yizhou Yu
- Shree K. Nayar
- Fuxin Li
- Zhengzhe Liu
- Paul E. Debevec
- Rahul Sawhney
- Yi-Ling Qiao
- Liang Lin
- Bolei Zhou
- Tamal K. Dey
- David F. Fouhey
- Yu-Xiong Wang
- Sanghyun Kim
- Gunter Spöck
- Satoshi Saga
- Yuke Zhu
- Ali Dabouei
- Hans Hagen
- Stan Birchfield
- Fariborz Taherkhani
- Yinghao Xu
- Minsu Cho
- Zhipeng Bao
- Kalyan Sunkavalli
- Ko Nishino
- Corinna Kofler
- Ken Sills
- Ramesh Raskar
- Terrance DeVries
Venues
- CoRR
- CVPR
- ICCV
- ICRA
- Comput. Aided Geom. Des.
- Comput. Graph. Forum
- IEEE Trans. Pattern Anal. Mach. Intell.
- ACM Trans. Graph.
- Vis. Comput.
- Discret. Comput. Geom.
- WACV
- IEEE Trans. Vis. Comput. Graph.
- ICIP
- J. Math. Imaging Vis.
- Int. J. Comput. Vis.
- Rendering Techniques
- Sensors
- SIGGRAPH Posters
- ICLR
- 3DV
- CVPR Workshops
- Pattern Recognit. Lett.
- Comput. Aided Des.
- IEEE Access
- Image Vis. Comput.
- IEEE Trans. Image Process.
- Graph. Model.
- Comput. Vis. Image Underst.
- BMVC
- ICIAR
- Remote. Sens.
- SIGGRAPH
- Pattern Recognit.
- IEEE Trans. Geosci. Remote. Sens.
- CRV
- Ars Comb.
- IGARSS
- COLT
- Discret. Math.
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