PHOTOMETRIC INVARIANT
Experts
- Theo Gevers
- Joost van de Weijer
- Arnold W. M. Smeulders
- In-So Kweon
- Nojun Kwak
- Partha Das
- Shanshan Zhong
- Sezer Karaoglu
- Lei Guo
- Daifeng Li
- Harro M. G. Stokman
- Wei-Ning Hsu
- Wonhyuk Ahn
- Fumihiko Sakaue
- Chengwen Yu
- Sungho Kim
- Jun Sato
- Satya P. Mallick
- Wei-Yang Lin
- Jiho Jang
- David J. Kriegman
- Todd E. Zickler
- Liang Lin
- Nigel Boston
- Kenji Nagao
- KiYoon Yoo
- Wushao Wen
- Zhongzhan Huang
- Qianjin Zhang
- Jinghui Qin
- Peter N. Belhumeur
- Zhe Lin
- Yukitoshi Watanabe
- James R. Glass
- Hao Zhang
- Jihye Choi
- Jing Li
- Kelvin Kian Loong Wong
- Liangcai Zeng
Venues
- CoRR
- ICCV
- ICIP
- DAGM-Symposium
- IROS
- IEEE Trans. Pattern Anal. Mach. Intell.
- AAAI
- USENIX Security Symposium
- Remote. Sens.
- ICPR
- IEEE Trans. Image Process.
- Int. J. Comput. Vis.
- ICNC-FSKD
- J. Symb. Log.
- Color Imaging Conference
- Shape Modeling International
- ACL (1)
- MVA
- BMVC
- IPSJ Trans. Comput. Vis. Appl.
- Computing
- Neural Comput.
- IEEE Trans. Aerosp. Electron. Syst.
- IC-AI
- WWW
- MMSP
- CGIV
- CVPR
- FG
- ADHOC-NOW
- IGARSS
- CVPR (2)
- IEEE Geosci. Remote. Sens. Lett.
- Eur. J. Comb.
- Inf. Sci.
- IEEE Trans. Geosci. Remote. Sens.
- IGARSS (1)
- VISAPP (1)
- ICRA
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