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Experts
- Edwin R. Hancock
- Katsushi Ikeuchi
- Hiroshi Kawasaki
- Paul E. Debevec
- Hans-Peter Seidel
- Qingqing Wu
- Ryo Furukawa
- Pieter Peers
- Robert B. Fisher
- Luc Van Gool
- Zhan Song
- Shree K. Nayar
- Imari Sato
- Roberto Cipolla
- Jonathan Li
- Sukhan Lee
- Ko Nishino
- Yoichi Sato
- Takahiro Okabe
- William A. P. Smith
- Daniel Cohen-Or
- Ryusuke Sagawa
- Abhijeet Ghosh
- Shunlin Liang
- Junyu Dong
- Hideo Saito
- Aly A. Farag
- Wen Wang
- Daisuke Miyazaki
- Ruigang Yang
- Daniel Cremers
- Kwan-Yee Kenneth Wong
- Thomas W. Sederberg
- Cheng Wang
- Hong Qin
- Miaomiao Liu
- Marc Pollefeys
- Joaquim Salvi
- Ron Kimmel
Venues
- CoRR
- Sensors
- Remote. Sens.
- IGARSS
- CVPR
- ICRA
- IEEE Trans. Geosci. Remote. Sens.
- ICCV
- IEEE Access
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Instrum. Meas.
- IROS
- Comput. Graph. Forum
- ACM Trans. Graph.
- ICIP
- Comput. Aided Des.
- Comput. Aided Geom. Des.
- IEEE Geosci. Remote. Sens. Lett.
- ICPR
- Vis. Comput.
- IEEE Trans. Vis. Comput. Graph.
- Comput. Vis. Image Underst.
- BMVC
- Pattern Recognit.
- EMBC
- Comput. Graph.
- Image Vis. Comput.
- Int. J. Comput. Vis.
- ICASSP
- Int. J. Appl. Earth Obs. Geoinformation
- MVA
- IEEE Robotics Autom. Lett.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- NEMS
- IEEE Trans. Image Process.
- J. Comput. Phys.
- 3DV
- IMR
- IEEE Trans. Ind. Electron.
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