MULTI VIEW GEOMETRY
Experts
- Tomás Pajdla
- J. Rafael Sendra
- Peter F. Sturm
- Jun Sato
- Pavel Rojtberg
- Zhengyou Zhang
- Zuzana Kukelova
- Juan Gerardo Alcázar
- Jean Ponce
- Fuchao Wu
- Zhanyi Hu
- Chaoping Xing
- Imran N. Junejo
- Miroslav Lávicka
- Yuncai Liu
- Hui Zhang
- Long Quan
- Helder Araújo
- Juana Sendra
- Michal Polic
- Aly A. Farag
- Wolfgang Förstner
- Gabriel Taubin
- Jan Vrsek
- Kwan-Yee Kenneth Wong
- Alexander Barg
- Carlos Ricolfe-Viala
- Sonia Pérez-Díaz
- Kosuke Takahashi
- Reinhard Klette
- Moumen T. Ahmed
- Sheng-Wen Shih
- Ryutaroh Matsumoto
- Andrew W. Fitzgibbon
- João Pedro Barreto
- Kai Jin
- Marc Pollefeys
- Itzhak Tamo
- Torsten Sattler
Venues
- CoRR
- ICCV
- CVPR
- ICPR
- ICRA
- IEEE Trans. Pattern Anal. Mach. Intell.
- BMVC
- Comput. Aided Geom. Des.
- Pattern Recognit.
- Sensors
- Mach. Vis. Appl.
- J. Symb. Comput.
- IEEE Trans. Inf. Theory
- ICPR (1)
- IEEE Access
- IROS
- ICIP
- WACV
- IEEE Trans. Instrum. Meas.
- J. Comput. Appl. Math.
- ICASSP
- MVA
- VISIGRAPP (4: VISAPP)
- Comput. Vis. Image Underst.
- Pattern Recognit. Lett.
- CVPR Workshops
- Image Vis. Comput.
- ECCV (2)
- Int. J. Comput. Vis.
- ISSAC
- IEEE Trans. Image Process.
- ICIP (2)
- IMA Conference on the Mathematics of Surfaces
- IEICE Trans. Inf. Syst.
- ICONIP (2)
- ACCV (2)
- ECCV (1)
- ITSC
- CVPR (1)
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