MULTI VIEW GEOMETRY
Experts
- Tomás Pajdla
- Peter F. Sturm
- J. Rafael Sendra
- Zhengyou Zhang
- Juan Gerardo Alcázar
- Pavel Rojtberg
- Jun Sato
- Zuzana Kukelova
- Jean Ponce
- Zhanyi Hu
- Fuchao Wu
- Chaoping Xing
- Wolfgang Förstner
- Hui Zhang
- Alexander Barg
- Juana Sendra
- Gabriel Taubin
- Michal Polic
- Helder Araújo
- Imran N. Junejo
- Miroslav Lávicka
- Jan Vrsek
- Yuncai Liu
- Carlos Ricolfe-Viala
- Aly A. Farag
- Long Quan
- Kwan-Yee Kenneth Wong
- Moumen T. Ahmed
- Hideo Saito
- Gopi Krishna Tummala
- Torsten Sattler
- Yawen Lu
- Andrea Torsello
- Ganesan Ramalingam
- Jean-Marc Lavest
- Prasun Sinha
- Guoyu Lu
- Sonia Pérez-Díaz
- Itzhak Tamo
Venues
- CoRR
- ICCV
- ICPR
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICRA
- BMVC
- Comput. Aided Geom. Des.
- Sensors
- Pattern Recognit.
- Mach. Vis. Appl.
- IEEE Trans. Inf. Theory
- J. Symb. Comput.
- ICPR (1)
- IEEE Access
- IROS
- ICIP
- ICASSP
- WACV
- IEEE Trans. Instrum. Meas.
- Pattern Recognit. Lett.
- J. Comput. Appl. Math.
- Comput. Vis. Image Underst.
- MVA
- VISIGRAPP (4: VISAPP)
- Int. J. Comput. Vis.
- Image Vis. Comput.
- IEEE Trans. Image Process.
- ICIP (2)
- CVPR Workshops
- ISSAC
- ECCV (2)
- ICONIP (2)
- IMA Conference on the Mathematics of Surfaces
- 3DPVT
- IEEE Trans. Robotics Autom.
- ACCV (2)
- ISBI
- AVSS
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