MANUFACTURING ENVIRONMENT
Experts
- Hesuan Hu
- MengChu Zhou
- Keyi Xing
- Zhiwu Li
- Yang Liu
- Fei Tao
- Lin Zhang
- Naiqi Wu
- Damien Trentesaux
- Reza Tavakkoli-Moghaddam
- Paulo Leitão
- Lyès Benyoucef
- Kira Barton
- Dawn M. Tilbury
- Xiaolan Xie
- Yihai He
- Yan Yang
- Birgit Vogel-Heuser
- Andrea Matta
- Jose L. Martinez Lastra
- Alexandre Dolgui
- Chen Chen
- Xun Xu
- Andrew Y. C. Nee
- Yongkui Liu
- Frank DiCesare
- Maria Pia Fanti
- Weiming Shen
- Nan Du
- Jingshan Li
- George Q. Huang
- Marco Taisch
- MuDer Jeng
- Adriana Giret
- Francesco Martinelli
- Xiao Han
- John W. Fowler
- Ilya Kovalenko
- Ershun Pan
Venues
- WSC
- Int. J. Comput. Integr. Manuf.
- Int. J. Prod. Res.
- Comput. Ind. Eng.
- J. Intell. Manuf.
- ICRA
- CoRR
- CASE
- IEEE Access
- ETFA
- Eur. J. Oper. Res.
- SMC
- Comput. Ind.
- IEEE Trans Autom. Sci. Eng.
- Int. J. Manuf. Technol. Manag.
- APMS (2)
- SOHOMA
- IEEE Trans. Autom. Control.
- Reliab. Eng. Syst. Saf.
- Sensors
- ACC
- Robotics Comput. Integr. Manuf.
- APMS (1)
- IEEM
- IEEE Trans. Syst. Man Cybern. Syst.
- APMS
- Expert Syst. Appl.
- INDIN
- Ind. Manag. Data Syst.
- IEEE Trans. Ind. Informatics
- Oper. Res.
- IEEE Trans. Robotics Autom.
- BASYS
- Int. J. Manuf. Res.
- Int. J. Autom. Technol.
- Ann. Oper. Res.
- J. Oper. Res. Soc.
- Autom.
- Eng. Appl. Artif. Intell.
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